PanithanS/Wafers-Defect-Recognition-using-Visual-Transformer

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

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This helps semiconductor manufacturers quickly identify and classify defects on silicon wafers during production. You provide images of wafer maps, and it tells you the specific type of defect present, even if multiple types occur together. This helps quality control engineers and operations managers understand root causes, reduce waste, and improve product quality.

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Use this if you need an automated system to accurately classify various single and mixed defect patterns on semiconductor wafers to enhance manufacturing efficiency and yield.

Not ideal if you are looking for a system to detect new, previously unseen defect types rather than classifying known patterns.

semiconductor manufacturing wafer inspection defect analysis quality control yield management
Stale 6m No Package No Dependents
Maintenance 0 / 25
Adoption 8 / 25
Maturity 16 / 25
Community 18 / 25

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Language

Jupyter Notebook

License

MIT

Last pushed

Oct 01, 2023

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